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Simulated electron beam trajectories toward a field ion microscopy specimenLARSON, D. J; CAMUS, P. P; KELLY, T. F et al.Applied surface science. 1993, Vol 67, Num 1-4, pp 473-480, issn 0169-4332Conference Paper

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Feldionenmikroskopie der Gitterstörungen im Metallkristallen = Microscopie ionique à émission de champ pour l'étude des défauts cristallins dans les cristaux métalliques = Field ion microscopy of lattice defects in metallic crystalsKRAUTZ, E.Optik (Stuttgart). 1987, Vol 77, Num 1, pp 35-38, issn 0030-4026Article

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Surface segregation and diffusion kinetics study of a Pt-Ir alloy using the time-of-flight atom-probe field ion microscope = Etude de la ségrégation de surface et de la cinétique de diffusion d'un alliage Pt-Ir en utilisant le microscope ionique à effet de champ à sonde atomique à temps de volAHMAD, M; TSONG, T. T.Applied physics letters. 1984, Vol 44, Num 1, pp 40-42, issn 0003-6951Article

Developing a method to determine linewidth based on counting the atom-spacings across a lineSILVER, R. M; JENSEN, C. P; TSAI, V et al.SPIE proceedings series. 1998, pp 441-460, isbn 0-8194-2777-2Conference Paper

Atom-probe field ion microscopy and applications to surface scienceTSONG, T. T.Surface science. 1994, Vol 299-300, Num 1-3, pp 153-169, issn 0039-6028Article

Simulation of FIM images of precipitation-hardening alloysSANO, N.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 297-302, issn 0169-4332Conference Paper

Theory of electron tunneling in scanning tunneling microscopy and field ion microscopyTSUKADA, M.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 312-321, issn 0169-4332Conference Paper

Composite thin-film characterization by atom probe field ion microscopyMELMED, A. J; CAMUS, P. P.Ultramicroscopy. 1991, Vol 35, Num 3-4, pp 277-287, issn 0304-3991Article

Imaging gas concentration in the field ion microscope: a theoretical analysisDE CASTILHO, C. M. C; KINGHAM, D. R.Surface science. 1988, Vol 204, Num 3, pp 568-586, issn 0039-6028Article

Icosahedral symmetry in a metallic phase observed by field-ion microscopy = Symétrie icosaédrique dans une phase métallique observée par microscopie ionique à effet de champMELMED, A. J; KLEIN, R.Physical review letters. 1986, Vol 56, Num 14, pp 1478-1481, issn 0031-9007Article

Ion trajectories in atom probe field ion microscopy and gas field ion sourcesDE CASTILHO, C. M. C.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 17, pp 2261-2265, issn 0022-3727Article

Atomic events at lattice steps and clusters: a direct view of crystal growth processesEHRLICH, G.Surface science. 1995, Vol 331-333, pp 865-877, issn 0039-6028, bConference Paper

Lateral and depth scale calibration of the position sensitive atom probeHYDE, J. M; CEREZO, A; SETNA, R. P et al.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 382-391, issn 0169-4332Conference Paper

Negative field ion microscopy of the initial stages of polymerization of tetracyanoethyleneTHEISS, A; RÖLLGEN, F. W.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 307-311, issn 0169-4332Conference Paper

Study of proper conditions for quantitative atom-probe analysisROLANDER, U; ANDREN, H.-O.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 392-402, issn 0169-4332Conference Paper

Methods for a precision measurement of ionic masses and appearance energies using the pulsed-laser time-of-flight atom probeTSONG, T. T; LIOU, Y; MCLANE, S. B et al.Review of scientific instruments. 1984, Vol 55, Num 8, pp 1246-1254, issn 0034-6748Article

Field ion microscopy and beyond in some aspects of surface and nanoscience applicationsTSONG, Tien T.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 111-115, issn 0142-2421, 5 p.Conference Paper